1215 search results - page 46 / 243 » Testing in the Distributed Test Architecture: An Extended Ab... |
HPCA
2006
IEEE
14 years 10 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
ICSOC
2010
Springer
13 years 7 months ago
2010
Springer
Abstract. The modularity of Service-oriented Architectures (SOA) allows to establish complex distributed systems comprising e.g., services, clients, brokers, and workflow engines. ...
CORR
2002
Springer
13 years 9 months ago
2002
Springer
This paper describes the LDL++ system and the research advances that have enabled its design and development. We begin by discussing the new nonmonotonic and nondeterministic cons...
ICPR
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract--This paper extends the transition method for binarization based on transition pixels, a generalization of edge pixels. This method originally computes transition threshol...
DAC
2011
ACM
12 years 9 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...