1618 search results - page 149 / 324 » Testing random number generators |
FGR
2004
IEEE
14 years 2 months ago
2004
IEEE
Data collection for both training and testing a classifier is a tedious but essential step towards face detection and recognition. All of the statistical methods suffer from this ...
DSD
2005
IEEE
14 years 3 months ago
2005
IEEE
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subta...
ITC
2000
IEEE
14 years 2 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
JISE
2000
13 years 10 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
ALT
2005
Springer
14 years 7 months ago
2005
Springer
This paper deals with an unusual phenomenon where most machine learning algorithms yield good performance on the training set but systematically worse than random performance on th...