1618 search results - page 28 / 324 » Testing random number generators |
COMPSAC
2005
IEEE
14 years 3 months ago
2005
IEEE
Web services and service-oriented architecture are emerging technologies that are changing the way we develop and use computer software. Due to the standardization of web services...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
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Lecture Notes
Comparing systems using measurement, simulation, and queueing models. Common mistakes and how to avoid them, selection of techniques and metrics, art of data presentation, summariz...
MTDT
2000
IEEE
14 years 2 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
ITC
1998
IEEE
14 years 2 months ago
1998
IEEE
This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model a...