1618 search results - page 50 / 324 » Testing random number generators |
ASE
2006
13 years 10 months ago
2006
Finite state machines have been used to model a number of classes of system and there has thus been much interest in the automatic generation of test sequences from finite state m...
EURODAC
1990
IEEE
14 years 1 months ago
1990
IEEE
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
FATES
2004
Springer
14 years 3 months ago
2004
Springer
We present a technique for specifying coverage criteria and a method for generating test suites for systems whose behaviours can be described as extended finite state machines (EF...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 7 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
GECCO
2004
Springer
14 years 3 months ago
2004
Springer
Abstract. This work introduces a new evolutionary algorithm that adapts the operator probabilities (rates) while evolves the solution of the problem. Each individual encodes its ge...