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DAC
2007
ACM
14 years 11 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
KBSE
2005
IEEE
14 years 3 months ago
Automated test generation for engineering applications
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
Songtao Xia, Ben Di Vito, César Muño...
ETS
2009
IEEE
79views Hardware» more  ETS 2009»
13 years 7 months ago
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
Michael A. Kochte, Christian G. Zoellin, Hans-Joac...
CDC
2010
IEEE
115views Control Systems» more  CDC 2010»
13 years 5 months ago
Distributed statistical estimation of the number of nodes in sensor networks
The distributed estimation of the number of active sensors in a network can be important for estimation and organization purposes. We propose a design methodology based on the foll...
Damiano Varagnolo, Gianluigi Pillonetto, Luca Sche...
SIGMOD
2000
ACM
141views Database» more  SIGMOD 2000»
14 years 2 months ago
Counting, Enumerating, and Sampling of Execution Plans in a Cost-Based Query Optimizer
Testing an SQL database system by running large sets of deterministic or stochastic SQL statements is common practice in commercial database development. However, code defects oft...
Florian Waas, César A. Galindo-Legaria