1618 search results - page 93 / 324 » Testing random number generators |
DATE
2004
IEEE
14 years 1 months ago
2004
IEEE
This paper presents 3LSSD, a novel, easilyautomatable approach for scan insertion and ATPG of asynchronous circuits. 3LSSD inserts scan latches only into global circuit feedback p...
ACL
2010
13 years 8 months ago
2010
We present a probabilistic model extension to the Tesni`ere Dependency Structure (TDS) framework formulated in (Sangati and Mazza, 2009). This representation incorporates aspects ...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurement...
ETS
2006
IEEE
14 years 4 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
CTRSA
2009
Springer
14 years 4 months ago
2009
Springer
Abstract. A redactable signature scheme for a string of objects supports verification even if multiple substrings are removed from the original string. It is important that the re...