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ECCC
2010
117views more  ECCC 2010»
13 years 6 months ago
Nearly Tight Bounds for Testing Function Isomorphism
We study the problem of testing isomorphism (equivalence up to relabelling of the variables) of two Boolean functions f, g : {0, 1}n → {0, 1}. Our main focus is on the most stud...
Sourav Chakraborty, David García-Soriano, A...
ASPDAC
1998
ACM
105views Hardware» more  ASPDAC 1998»
14 years 3 days ago
Techniques for Functional Test Pattern Execution
Functional debugging often dominates the time and cost of the ASIC system development, mainly due to the limited controllability and observability of the storage elements in desig...
Inki Hong, Miodrag Potkonjak
SIGIR
2011
ACM
12 years 10 months ago
Pseudo test collections for learning web search ranking functions
Test collections are the primary drivers of progress in information retrieval. They provide a yardstick for assessing the effectiveness of ranking functions in an automatic, rapi...
Nima Asadi, Donald Metzler, Tamer Elsayed, Jimmy L...
DAC
2003
ACM
14 years 8 months ago
Coverage directed test generation for functional verification using bayesian networks
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
Shai Fine, Avi Ziv
DFT
2009
IEEE
106views VLSI» more  DFT 2009»
14 years 2 months ago
Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points
Recently, a new test point insertion method for pseudo-random built-in self-test (BIST) was proposed in [Yang 09] which tries to use functional flip-flops to drive control test po...
Joon-Sung Yang, Benoit Nadeau-Dostie, Nur A. Touba