2006 search results - page 281 / 402 » Testing with Respect to Concerns |
ICPR
2002
IEEE
14 years 11 months ago
2002
IEEE
In this paper the effectiveness of a corrective learning algorithm MIL (Mirror Image Learning) [1], [2] is comparatively studied with that of GLVQ (Generalized Learning Vector Qua...
GIS
2003
ACM
14 years 11 months ago
2003
ACM
We present a technique for creating a digital elevation model (DEM) from grid-based contour data. The method computes new, intermediate contours in between existing isolines. Thes...
DAC
2009
ACM
14 years 11 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
DAC
2003
ACM
14 years 11 months ago
2003
ACM
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
This paper describes an ultra low power active RFID tag and its automated design flow. RFID primitives to be supported by the tag are enumerated with RFID macros and the behavior ...