2006 search results - page 28 / 402 » Testing with Respect to Concerns |
ASPDAC
2000
ACM
13 years 11 months ago
2000
ACM
Testing embedded memories is becoming an industry-wide concern with the advent of deep-submicron technology and system-on-chip applications. We present a prototype chip for a progr...
ITC
2003
IEEE
14 years 25 days ago
2003
IEEE
— Being able to test the intrinsic performance of a device under test (DUT) has always been the main goal of a test engineer. Achieving this goal is becoming increasingly diffic...
ICST
2009
IEEE
13 years 5 months ago
2009
IEEE
A software development process is conceptually an abstract form of model transformation, starting from an enduser model of requirements, through to a system model for which code c...
ICSE
2009
IEEE-ACM
14 years 8 months ago
2009
IEEE-ACM
Since manual black-box testing of GUI-based APplications (GAPs) is tedious and laborious, test engineers create test scripts to automate the testing process. These test scripts in...
TACAS
2005
Springer
14 years 1 months ago
2005
Springer
This paper addresses the problem of generating symbolic test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of rea...