2006 search results - page 55 / 402 » Testing with Respect to Concerns |
DATE
2004
IEEE
14 years 16 days ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
ENTCS
1998
13 years 8 months ago
1998
We consider a generalisation of Larsen and Skou’s [19] reactive probabilistic transition systems which exhibit three kinds of choice: action-guarded probabilistic choice, extern...
OSDI
2008
ACM
14 years 9 months ago
2008
ACM
Hard disk drives returned back to Seagate undergo the Field Return Incoming Test. During the test, the available logs in disk drives are collected, if possible. These logs contain...
DFT
2003
IEEE
14 years 2 months ago
2003
IEEE
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
ICDM
2002
IEEE
14 years 1 months ago
2002
IEEE
Segmentation is a popular technique for discovering structure in time series data. We address the largely open problem of estimating the number of segments that can be reliably di...