2006 search results - page 9 / 402 » Testing with Respect to Concerns |
XPU
2004
Springer
14 years 24 days ago
2004
Springer
Abstract. While there are many excellent acceptance testing tools and frameworks available today, this paper presents an alternative approach, involving generating code from tests ...
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
EUSFLAT
2007
13 years 9 months ago
2007
This paper concerns problem of selection of optimal subset of irredundant unconditional diagnostic tests by means of evolutionary approach. The method of correction of features’...
GI
2009
Springer
14 years 3 days ago
2009
Springer
Abstract. In this paper we introduce SYGo, an innovative hide-andseek game which is part of the AMOGA research project of the University of Bonn in cooperation with and funded by D...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...