2877 search results - page 128 / 576 » The Complexity of Planarity Testing |
127
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ICCAD
2006
IEEE
16 years 1 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
130
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KBSE
2008
IEEE
15 years 10 months ago
2008
IEEE
One activity performed by developers during regression testing is test-suite augmentation, which consists of assessing the adequacy of a test suite after a program is modified an...
119
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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
136
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ETS
2006
IEEE
15 years 10 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
125
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ICECCS
1997
IEEE
15 years 8 months ago
1997
IEEE
Software architectures can play a role in improving the testing process of complex systems. In particular, descriptions of the software architecture can be useful to drive integra...