2877 search results - page 40 / 576 » The Complexity of Planarity Testing |
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
—The complexity of the test infrastructure and test strategies in systems-on-chip approaches the complexity of the functional design space. This paper presents test design space ...
ICCV
1999
IEEE
14 years 11 months ago
1999
IEEE
We propose a flexible new technique to easily calibrate a camera. It only requires the camera to observe a planar pattern shown at a few (at least two) different orientations. Eit...
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
FEDCSIS
2011
12 years 8 months ago
2011
Abstract—The Future Internet will be a complex interconnection of services, applications, content and media, on which our society will become increasingly dependent. Time to mark...
ICRA
2003
IEEE
14 years 2 months ago
2003
IEEE
Abstract— In this paper, we present how moment invariants can be used to design a decoupled 2D visual servoing scheme and to minimize the nonlinearity of the interaction matrix r...