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ICCD
2006
IEEE
127views Hardware» more  ICCD 2006»
14 years 5 months ago
Power Droop Testing
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
ISPD
2010
ACM
205views Hardware» more  ISPD 2010»
14 years 3 months ago
Total sensitivity based dfm optimization of standard library cells
Standard cells are fundamental circuit building blocks designed at very early design stages. Nanometer standard cells are prone to lithography proximity and process variations. Ho...
Yongchan Ban, Savithri Sundareswaran, David Z. Pan
CCGRID
2009
IEEE
14 years 3 months ago
C-Meter: A Framework for Performance Analysis of Computing Clouds
—Cloud computing has emerged as a new technology that provides large amount of computing and data storage capacity to its users with a promise of increased scalability, high avai...
Nezih Yigitbasi, Alexandru Iosup, Dick H. J. Epema...
ICST
2009
IEEE
14 years 3 months ago
A Model Building Process for Identifying Actionable Static Analysis Alerts
Automated static analysis can identify potential source code anomalies early in the software process that could lead to field failures. However, only a small portion of static ana...
Sarah Smith Heckman, Laurie A. Williams
ICVS
2009
Springer
14 years 3 months ago
Visual Registration Method for a Low Cost Robot
Abstract— An autonomous mobile robot must face the correspondence or data association problem in order to carry out tasks like place recognition or unknown environment mapping. I...
David Aldavert, Arnau Ramisa, Ricardo Toledo, Ramo...