688 search results - page 32 / 138 » The Flow Set with Partial Order |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
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Publication
In this paper, we present a novel framework for computing centerlines for both 2D and 3D shape analysis. The framework works as follows: an object centerline point is
selected aut...
112
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Presentation
In this paper, we present a novel framework for computing centerlines for both 2D and 3D shape analysis. The framework works as follows: an object centerline point is selected auto...
TIP
2002
13 years 7 months ago
2002
In recent years, curve evolution, applied to a single contour or to the level sets of an image via partial differential equations, has emerged as an important tool in image process...
ICCAD
2000
IEEE
13 years 11 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...