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ASAP
2008
IEEE
142views Hardware» more  ASAP 2008»
14 years 2 months ago
Managing multi-core soft-error reliability through utility-driven cross domain optimization
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
Wangyuan Zhang, Tao Li
HPCA
2008
IEEE
14 years 8 months ago
DeCoR: A Delayed Commit and Rollback mechanism for handling inductive noise in processors
Increases in peak current draw and reductions in the operating voltages of processors continue to amplify the importance of dealing with voltage fluctuations in processors. Noise-...
Meeta Sharma Gupta, Krishna K. Rangan, Michael D. ...
MICRO
1999
IEEE
105views Hardware» more  MICRO 1999»
14 years 9 hour ago
DIVA: A Reliable Substrate for Deep Submicron Microarchitecture Design
Building a high-performance microprocessor presents many reliability challenges. Designers must verify the correctness of large complex systems and construct implementations that ...
Todd M. Austin
DAMON
2008
Springer
13 years 9 months ago
Critical sections: re-emerging scalability concerns for database storage engines
Critical sections in database storage engines impact performance and scalability more as the number of hardware contexts per chip continues to grow exponentially. With enough thre...
Ryan Johnson, Ippokratis Pandis, Anastasia Ailamak...
MMS
2007
13 years 7 months ago
Collaborative video searching on a tabletop
Almost all system and application design for multimedia systems is based around a single user working in isolation to perform some task yet much of the work for which we use comput...
Alan F. Smeaton, Hyowon Lee, Colum Foley, Sin&eacu...