59 search results - page 3 / 12 » The Impact of Technology Scaling on Lifetime Reliability |
ICCAD
2008
IEEE
14 years 5 months ago
2008
IEEE
Graphene nanoribbon FETs (GNRFETs) have emerged as a promising candidate for nanoelectronics applications. This paper summarizes (i) current understanding and prospects for GNRFET...
SENSYS
2004
ACM
14 years 2 months ago
2004
ACM
Habitat and environmental monitoring is a driving application for wireless sensor networks. We present an analysis of data from a second generation sensor networks deployed during...
HICSS
2000
IEEE
14 years 29 days ago
2000
IEEE
Distributed energy resources (DER) are in transition from the lab to the marketplace. The defining characteristic of DER is that they are active devices installed at the distribut...
ISVLSI
2007
IEEE
14 years 2 months ago
2007
IEEE
As CMOS technology continues to scale, copper interconnect (CuI) will hinder the performance and reliability of Field Programmable Gate Arrays (FPGA) motivating the need for alter...
ASPLOS
2010
ACM
14 years 3 months ago
2010
ACM
DRAM is facing severe scalability challenges in sub-45nm technology nodes due to precise charge placement and sensing hurdles in deep-submicron geometries. Resistive memories, suc...