1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
We present a generic framework for compression of densely sampled 3D surfaces in order to satisfy the increasing demand for storing large amounts of 3D content. We decompose a giv...
Sparsity of target space in subsurface imaging problem is used within the framework of the compressive sensing (CS) theory in recent publications to decrease the data acquisition ...
Abstract. A type-theoretic framework for formal reasoning with different logical foundations is introduced and studied. With logic-enriched type theories formulated in a logical fr...