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VLSID
2004
IEEE
93views VLSI» more  VLSID 2004»
14 years 7 months ago
Random Access Scan: A solution to test power, test data volume and test time
Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara
ATS
2004
IEEE
126views Hardware» more  ATS 2004»
13 years 11 months ago
Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumptio
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
Youhua Shi, Shinji Kimura, Nozomu Togawa, Masao Ya...
ISVLSI
2007
IEEE
121views VLSI» more  ISVLSI 2007»
14 years 1 months ago
Data Recovery Block Design for Impulse Modulated Power Line Communications in a Microprocessor
Power line communications (PLC) using impulse ultra wideband (UWB) in a microprocessor had been proposed for ubiquitous access of internal nodes for test/debug purposes. In this p...
Rajesh Thirugnanam, Dong Sam Ha, T. M. Mak
VTC
2006
IEEE
108views Communications» more  VTC 2006»
14 years 1 months ago
A New Pricing Function for Power Control Game in Wireless Data Networks
— This paper presents a new pricing function for noncooperative power control game in a single cell CDMA data network. Considering a utility function for each terminal, the purpo...
Abdorasoul Ghasemi, Karim Faez, Mehdi Dehghan
DMSN
2006
ACM
14 years 1 months ago
Network scheduling for data archiving applications in sensor networks
Since data archiving in sensor networks is a communication intensive application, a careful power management of communication is of critical importance for such networks. An examp...
Yong Yao, S. M. Nazrul Alam, Johannes Gehrke, Serg...