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40

VLSID
2004
IEEE

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Random Access Scan: A solution to test power, test data volume and test time

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Random Access Scan: A solution to test power, test data volume and test time

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Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara

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Computer Architecture | Test Data Volume | Test Power | VLSID 2004 |

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Added	01 Dec 2009
Updated	01 Dec 2009
Type	Conference
Year	2004
Where	VLSID
Authors	Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara

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