19 search results - page 3 / 4 » The Test Vector Problem and Limitations to Evolving Digital ... |
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
EH
2004
IEEE
13 years 11 months ago
2004
IEEE
The work presented here tackles the problem of designing a unipolar 6-bit digital-to-analog converter (DAC) with a voltage mode output by hardware evolution. Thereby a Field Progr...
ATS
2002
IEEE
14 years 26 days ago
2002
IEEE
As the deep sub-micron techniques evolving, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to the access limitations. ...
FPGA
2005
ACM
14 years 1 months ago
2005
ACM
Floating-point Sparse Matrix-Vector Multiplication (SpMXV) is a key computational kernel in scientific and engineering applications. The poor data locality of sparse matrices sig...