Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
In this paper, we consider verifying properties of mixed-signal circuits, i.e., circuits for which there is an interaction between analog (continuous) and digital (discrete) values...
Design and validation of mixed-signal integrated systems require evel model abstractions. Generalized Volterra series based models have been successfully applied for analog and RF...
Estimation of maximal power consumption is an essential task in VLSI circuit realizations since power value significantly affects the reliability of the circuits. The key issue o...
The neocortex has a remarkably uniform neuronal organization, suggesting that common principles of processing are employed throughout its extent. In particular, the patterns of co...
Ueli Rutishauser, Rodney J. Douglas, Jean-Jacques ...