570 search results - page 96 / 114 » The behavior of resistive circuits |
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 6 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
VLSI
2010
Springer
13 years 3 months ago
2010
Springer
A novel Capacitor array structure for Successive Approximation Register (SAR) ADC is proposed. This circuit efficiently utilizes charge recycling to achieve high-speed of operation...
ICCAD
1995
IEEE
14 years 5 days ago
1995
IEEE
We address the problem of minimizing power consumption in behavioral synthesis of data-dominated circuits. The complex nature of power as a cost function implies that the effects ...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
The continuous minituarization of integrated circuits may reach atomic scales in a couple of decades. Some researchers have already built simple computation engines by manipulatin...
ICCAD
2002
IEEE
14 years 5 months ago
2002
IEEE
We investigate appropriate regimes for transmission line propagation of signals on digital integrated circuits. We start from exact solutions to the transmission line equations pr...