Extreme technology integration in the sub-micron regime comes with a rapid rise in heat dissipation and power density for modern processors. Dynamic voltage scaling is a widely us...
Amin Ansari, Shuguang Feng, Shantanu Gupta, Scott ...
— Verification remains an integral and crucial phase of today’s microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing...
High efficiency low voltage DC-DC conversion is a key enabler to the design of power-efficient integrated circuits. Typically a star configuration of the DC-DC converters, where o...
ABSTRACT Because of technology advances power consumption has emerged up as an important design issue in modern high-performance microprocessors. As a consequence, research on redu...
Diana Bautista, Julio Sahuquillo, Houcine Hassan, ...
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...