Sciweavers

492 search results - page 24 / 99
» The number of possibilities for random dating
Sort
View
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
14 years 2 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
HICSS
2006
IEEE
114views Biometrics» more  HICSS 2006»
14 years 2 months ago
New Probabilistic Method for Estimation of Equipment Failures and Development of Replacement Strategies
When large amount of statistical information about power system component failure rate is available, statistical parametric models can be developed for predictive maintenance. Oft...
Miroslav Begovic, Petar M. Djuric, Joshua Perkel, ...
CISS
2011
IEEE
13 years 12 days ago
The Restricted Isometry Property for block diagonal matrices
—In compressive sensing (CS), the Restricted Isometry Property (RIP) is a powerful condition on measurement operators which ensures robust recovery of sparse vectors is possible ...
Han Lun Yap, Armin Eftekhari, Michael B. Wakin, Ch...
DATE
2009
IEEE
129views Hardware» more  DATE 2009»
14 years 3 months ago
Distributed peak power management for many-core architectures
Recently proposed techniques for peak power management [5] involve centralized decision-making and assume quick evaluation of the various power management states. These techniques...
John Sartori, Rakesh Kumar
DATE
2009
IEEE
86views Hardware» more  DATE 2009»
14 years 3 months ago
A formal approach to design space exploration of protocol converters
In the field of chip design, hardware module reuse is a standard solution to the increasing complexity of chip architecture and the pressures to reduce time to market. In the abs...
Karin Avnit, Arcot Sowmya