"The documentation is missing or obsolete, and the original developers have departed. Your team has limited understanding of the system, and unit tests are missing for many, i...
Moments before the launch of every space vehicle, engineering discipline specialists must make a critical go/no-go decision. The cost of a false positive, allowing a launch in spi...
Jessica Lin, Eamonn J. Keogh, Stefano Lonardi, Jef...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
This paper reports on the 2nd Workshop on Model Driven Development of Advanced User Interfaces (MDDAUI’06) held on October 2nd, 2006 at the MoDELS’06 conference in Genova, Ital...
Jan Van den Bergh, Gerrit Meixner, Kai Breiner, An...
— As growing power dissipation and thermal effects disrupted the rising clock frequency trend and threatened to annul Moore’s law, the computing industry has switched its route...