This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
: SIMD arrays are likely to become increasingly important as coprocessors in domain specific systems as architects continue to leverage RAM technology in their design. The problem ...
Martin C. Herbordt, Jade Cravy, Renoy Sam, Owais K...
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
Andrew B. Kahng, Puneet Sharma, Rasit Onur Topalog...
— Cycle-accurate functional descriptions (CAFDs) are being widely adopted in integrated circuit (IC) design flows. Power estimation can potentially benefit from the inherent in...
Lin Zhong, Srivaths Ravi, Anand Raghunathan, Niraj...
The increasing popularity of SAT and BDD techniques in verification and synthesis encourages the search for additional speed-ups. Since typical SAT and BDD algorithms are exponent...