The European project COMSON (Coupled Multiscale Simulation and Optimization in Nanoelectronics) is a Marie Curie RTN project that involves five partners from academia and three fr...
Giuseppe Ali, Eleonora Bilotta, Lorella Gabriele, ...
Abstract—On-chip power density and temperature are rising exponentially with decreasing feature sizes. This alarming trend calls for temperature management at every level of syst...
Each semiconductor technology generation brings us closer to the imminent processor architecture heat wall, with all its associated adverse effects on system performance and reliab...
Damage pre-cursors based health management and prognostication methodology has been presented for electronic systems in harsh environments. The framework has been developed based ...
Temperature hot-spots have been known to cause severe reliability problems and to significantly increase leakage power. The register file has been previously shown to exhibit the ...