1476 search results - page 279 / 296 » Three-dimensional integrated circuits |
DAC
2003
ACM
14 years 10 months ago
2003
ACM
Power dissipation is becoming the most challenging design constraint in nanometer technologies. Among various design implementation schemes, standard cell ASICs offer the best pow...
DAC
2005
ACM
14 years 10 months ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
DAC
2005
ACM
14 years 10 months ago
2005
ACM
We propose a system architecture for real-time hardware speech recognition on low-cost, power-constrained devices. The system is intended to support real-time speech-based user in...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures. To improve via yield and reliability, redundant-via insertion is a highl...