1476 search results - page 27 / 296 » Three-dimensional integrated circuits |
CASES
2008
ACM
13 years 9 months ago
2008
ACM
We introduce the first approach that can actively control multiple hardware intellectual property (IP) cores used in an integrated circuit (IC). The IP rights owner(s) can remotel...
DATE
1997
IEEE
13 years 12 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
A new algorithm is presented that combines performance and variation objectives in a behavioural model for a given analogue circuit topology and process. The tradeoffs between per...
ITC
1996
IEEE
13 years 12 months ago
1996
IEEE
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
— It has been the conventional assumption that, due to the superlinear dependence of leakage power consumption on temperature, and widely varying on-chip temperature profiles, a...