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EUROGRAPHICS
2010
Eurographics
14 years 6 months ago
2010
Eurographics
This paper challenges the difficult problem of automatic semantic correspondence between two given shapes which are semantically similar but possibly geometrically very different...
ICCD
2006
IEEE
14 years 6 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
Adaptive body biasing (ABB) is a powerful technique that allows post-silicon tuning of individual manufactured dies such that each die optimally meets the delay and power constrai...
ICCAD
2005
IEEE
14 years 6 months ago
2005
IEEE
The increasing variability of process parameters leads to substantial parametric yield losses due to timing and leakage power constraints. Leakage power is especially affected by ...