4306 search results - page 123 / 862 » Timed Testing with TorX |
DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
ITC
2000
IEEE
14 years 2 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
ICCD
1999
IEEE
14 years 2 months ago
1999
IEEE
High resistance bridges (resistive bridges) are becoming more common. Such bridges cause speed failures. Published experimental results show that current tests are not good at det...
ETS
2006
IEEE
14 years 4 months ago
2006
IEEE
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...