4306 search results - page 138 / 862 » Timed Testing with TorX |
JSS
2008
13 years 8 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...
KBSE
2009
IEEE
14 years 5 months ago
2009
IEEE
—Developers often change software in ways that cause tests to fail. When this occurs, developers must determine whether failures are caused by errors in the code under test or in...
ISVLSI
2008
IEEE
14 years 4 months ago
2008
IEEE
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
GECCO
2007
Springer
14 years 4 months ago
2007
Springer
Algorithms for the construction of software interaction test suites have focussed on the special case of pairwise coverage; less is known about efficiently constructing test suite...
DSD
2005
IEEE
14 years 3 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...