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WISES
2003
13 years 8 months ago
Function Test Framework for Testing IO-Blocks in a Model-Based Rapid Prototyping Development Environment for Embedded Control Ap
— Testing and verification are important methods for gaining confidence in the reliability of a software product. Keeping this confidence up is especially difficult for softw...
Stefan Pitzek, Peter P. Puschner
ICSE
1994
IEEE-ACM
13 years 11 months ago
TestTube: A System for Selective Regression Testing
This paper describes a system called TESTTUBE that combines static and dynamic analysis to perform selective retesting of software systems written in C. TESTTUBEfirst identifies w...
Yih-Farn Chen, David S. Rosenblum, Kiem-Phong Vo
ENTCS
2007
116views more  ENTCS 2007»
13 years 7 months ago
Handling Model Changes: Regression Testing and Test-Suite Update with Model-Checkers
Several model-checker based methods to automated test-case generation have been proposed recently. The performance and applicability largely depends on the complexity of the model...
Gordon Fraser, Bernhard K. Aichernig, Franz Wotawa
EURODAC
1995
IEEE
198views VHDL» more  EURODAC 1995»
13 years 11 months ago
On generating compact test sequences for synchronous sequential circuits
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
Irith Pomeranz, Sudhakar M. Reddy
DSD
2010
IEEE
144views Hardware» more  DSD 2010»
13 years 7 months ago
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen