4306 search results - page 187 / 862 » Timed Testing with TorX |
ICCD
2005
IEEE
14 years 7 months ago
2005
IEEE
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
KBSE
2008
IEEE
14 years 5 months ago
2008
IEEE
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
QSIC
2005
IEEE
14 years 4 months ago
2005
IEEE
This paper proposes a stochastic voting for testing a large number of Web Services (WS) under group testing. In the future, a large number of WS will be available and they need to...