The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
James H. Andrews, Alex Groce, Melissa Weston, Ru-G...
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
This paper proposes a stochastic voting for testing a large number of Web Services (WS) under group testing. In the future, a large number of WS will be available and they need to...
Wei-Tek Tsai, Dawei Zhang, Raymond A. Paul, Yinong...