4306 search results - page 19 / 862 » Timed Testing with TorX |
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
In this paper, an analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test a...
CORR
2008
Springer
13 years 7 months ago
2008
Springer
Online monitoring remains an important requirement for a range of microsystems. The solution based on the injection of an actuating test stimulus into the bias structure of active...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...
COMPSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
Verifying Web Services (WS) in a dynamic Service Oriented Architecture (SOA) is challenging because new services can be composed at runtime using existing WS. Furthermore, in a co...
CORR
2008
Springer
13 years 7 months ago
2008
Springer
We study the problem of factoring univariate polynomials over finite fields. Under the assumption of the Extended Riemann Hypothesis (ERH), Gao [Gao01] designed a polynomial time ...