4306 search results - page 23 / 862 » Timed Testing with TorX |
COMPSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
Temporal correctness is crucial to the dependability of real-time systems. Few methods exist to test for temporal correctness and most existing methods are ad-hoc. A problem with ...
ETS
2010
IEEE
13 years 8 months ago
2010
IEEE
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...
NIPS
2007
13 years 9 months ago
2007
Most models of decision-making in neuroscience assume an infinite horizon, which yields an optimal solution that integrates evidence up to a fixed decision threshold; however, u...