4306 search results - page 55 / 862 » Timed Testing with TorX |
DATE
1998
IEEE
13 years 12 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
ICCAD
1997
IEEE
13 years 12 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
DBSEC
2008
13 years 9 months ago
2008
Abstract. Many security problems only become apparent after software is deployed, and in many cases a failure has occurred prior to the awareness of the problem. Although many woul...
ICSE
2012
IEEE-ACM
11 years 10 months ago
2012
IEEE-ACM
Abstract—Software testing is an expensive and time consuming process, often involving the manual creation of comprehensive regression test suites. However, current testing method...
ITC
1997
IEEE
13 years 12 months ago
1997
IEEE
Testing embedded cores is a challenge because access to core I/Os is limited. The user-defined logic (ZJDL) surrounding the core may restrict the set of test vectors that can be a...