4306 search results - page 98 / 862 » Timed Testing with TorX |
HASE
1998
IEEE
14 years 2 months ago
1998
IEEE
Residual defects is one of the most important factors that allow one to decide if a piece of software is ready to be released. In theory, one can find all the defects and count th...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
VTS
2007
IEEE
14 years 4 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
ICST
2008
IEEE
14 years 4 months ago
2008
IEEE
Web applications have rapidly become a critical part of business for many organizations. However, increased usage of web applications has not been reciprocated with corresponding ...
MTV
2007
IEEE
14 years 4 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...