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DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
Abstract—On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction...
VTS
2008
IEEE
14 years 4 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
TSE
2002
13 years 9 months ago
2002
Although there has been recent research into ways to design environments that enable end users to create their own programs, little attention has been given to helping these end u...
ITICSE
2005
ACM
14 years 3 months ago
2005
ACM
The complexity of languages like Java and C++ can make introductory programming classes in these languages extremely challenging for many students. Part of the complexity comes fr...
FOCS
1992
IEEE
14 years 2 months ago
1992
IEEE
We announce methods for e cient management of solvable matrix groups over nite elds. We show that solvability and nilpotence can be tested in polynomial-time. Such e ciency seems ...