37 search results - page 6 / 8 » Timing analysis in presence of supply voltage and temperatur... |
ICCAD
2008
IEEE
14 years 3 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
- Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while...
VTS
2000
IEEE
13 years 11 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
MICRO
2007
IEEE
14 years 29 days ago
2007
IEEE
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
SAC
2006
ACM
14 years 20 days ago
2006
ACM
: In chip design, one of the main objectives is to decrease its clock cycle; however, the existing approaches to timing analysis under uncertainty are based on fundamentally restri...