37 search results - page 7 / 8 » Timing analysis in presence of supply voltage and temperatur... |
ISLPED
2006
ACM
14 years 19 days ago
2006
ACM
As semiconductor manufacturing technology scales to smaller device sizes, the power consumption of clocked digital ICs begins to increase. Dynamic voltage and frequency scaling (D...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
DAC
2006
ACM
14 years 7 months ago
2006
ACM
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...
CASES
2009
ACM
13 years 10 months ago
2009
ACM
Reducing feature sizes and power supply voltage allows integrating more processing units (PUs) on multiprocessor system-on-chip (MPSoC) to satisfy the increasing demands of applic...
GLVLSI
2009
IEEE
13 years 10 months ago
2009
IEEE
In this paper, we present the design of a P4 (Power-PerformanceProcess-Parasitic) aware voltage controlled oscillator (VCO) at nanoCMOS technologies. Through simulations, we have ...