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ISQED
2009
IEEE
91views Hardware» more  ISQED 2009»
14 years 3 months ago
Variability-aware optimization of nano-CMOS Active Pixel Sensors using design and analysis of Monte Carlo experiments
We propose a novel design flow for mismatch and processvariation aware optimization of nanoscale CMOS Active Pixel Sensor (APS) arrays. As a case study, an 8 × 8 APS array is de...
Dhruva Ghai, Saraju P. Mohanty, Elias Kougianos
DATE
2009
IEEE
171views Hardware» more  DATE 2009»
14 years 15 days ago
Physically clustered forward body biasing for variability compensation in nanometer CMOS design
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
Ashoka Visweswara Sathanur, Antonio Pullini, Luca ...
ASYNC
2002
IEEE
124views Hardware» more  ASYNC 2002»
14 years 1 months ago
Synchronous Interlocked Pipelines
In a circuit environment that is becoming increasingly sensitive to dynamic power dissipation and noise, and where cycle time available for control decisions continues to decrease...
Hans M. Jacobson, Prabhakar Kudva, Pradip Bose, Pe...
ASPDAC
2009
ACM
161views Hardware» more  ASPDAC 2009»
14 years 3 months ago
Risk aversion min-period retiming under process variations
— Recent advances in statistical timing analysis (SSTA) achieve great success in computing arrival times under variations by extending sum and maximum operations to random variab...
Jia Wang, Hai Zhou
DATE
2009
IEEE
202views Hardware» more  DATE 2009»
14 years 3 months ago
Design as you see FIT: System-level soft error analysis of sequential circuits
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
Daniel Holcomb, Wenchao Li, Sanjit A. Seshia