We propose a novel design flow for mismatch and processvariation aware optimization of nanoscale CMOS Active Pixel Sensor (APS) arrays. As a case study, an 8 × 8 APS array is de...
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
Ashoka Visweswara Sathanur, Antonio Pullini, Luca ...
In a circuit environment that is becoming increasingly sensitive to dynamic power dissipation and noise, and where cycle time available for control decisions continues to decrease...
Hans M. Jacobson, Prabhakar Kudva, Pradip Bose, Pe...
— Recent advances in statistical timing analysis (SSTA) achieve great success in computing arrival times under variations by extending sum and maximum operations to random variab...
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...