266 search results - page 8 / 54 » Timing yield estimation using statistical static timing anal... |
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
Statistical static timing analysis (SSTA) is emerging as a solution for predicting the timing characteristics of digital circuits under process variability. For computing the stat...
ASPDAC
2006
ACM
14 years 2 months ago
2006
ACM
Statistical timing analysis has been widely applied to predict the timing yield of VLSI circuits when process variations become significant. Existing statistical latch timing met...
ICCAD
2009
IEEE
13 years 6 months ago
2009
IEEE
Process and environmental variations continue to present significant challenges to designers of high-performance integrated circuits. In the past few years, while much research has...
ICCAD
2003
IEEE
14 years 5 months ago
2003
IEEE
Static timing analysis is a critical step in design of any digital integrated circuit. Technology and design trends have led to significant increase in environmental and process v...