282 search results - page 55 / 57 » Transient Fault Detectors |
ICPP
2008
IEEE
14 years 1 months ago
2008
IEEE
The issue queue (IQ) is a key microarchitecture structure for exploiting instruction-level and thread-level parallelism in dynamically scheduled simultaneous multithreaded (SMT) p...
ISPASS
2007
IEEE
14 years 1 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
22
Voted
IEEEPACT
2006
IEEE
14 years 1 months ago
2006
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
PODC
2006
ACM
14 years 1 months ago
2006
ACM
Byzantine agreement algorithms typically assume implicit initial state consistency and synchronization among the correct nodes and then operate in coordinated rounds of informatio...