Reliability-aware power management (RAPM) has been a recent research focus due the negative effects of the popular power management technique dynamic voltage and frequency scaling ...
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
—The number of CPUs in chip multiprocessors is growing at the Moore’s Law rate, due to continued technology advances. However, new technologies pose serious reliability challen...
With the growing number of programmable processing elements in today's MultiProcessor System-on-Chip (MPSoC) designs, the synergy required for the development of the hardware...
Lei Gao, Kingshuk Karuri, Stefan Kraemer, Rainer L...