21 search results - page 3 / 5 » Transistor-level based defect tolerance for reliable nanoele... |
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
ARCS
2008
Springer
13 years 9 months ago
2008
Springer
Application details uncertain at design time as well as tolerance against permanent resource defects demand flexibility and redundancy. In this context, we present a strategy for p...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
MTDT
2003
IEEE
14 years 18 days ago
2003
IEEE
Advances in System-on-Chip (SoC) technology rely on manufacturing and assembling high-performance system cores for many critical applications. Among these cores, memory occupies t...