872 search results - page 28 / 175 » UML-based design test generation |
167
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ISQED
2002
IEEE
15 years 11 months ago
2002
IEEE
The design methods and the automation of the comparator circuit layout generation for a flash A/D converter are presented in this paper. The threshold inverter quantization (TIQ)...
167
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APCCAS
2006
IEEE
15 years 10 months ago
2006
IEEE
This paper considers z-domain transfer functions whose denominator polynomial possesses the property that the coefficient of zi is greater than the coefficient of zi-1 . Such trans...
170
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
181
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TCAD
2011
15 years 1 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
148
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ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...