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DAC
2005
ACM
14 years 8 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
KDD
2002
ACM
147views Data Mining» more  KDD 2002»
14 years 8 months ago
Visualized Classification of Multiple Sample Types
The goal of the knowledge discovery and data mining is to extract the useful knowledge from the given data. Visualization enables us to find structures, features, patterns, and re...
Li Zhang, Aidong Zhang, Murali Ramanathan
HPCA
2008
IEEE
14 years 8 months ago
Performance and power optimization through data compression in Network-on-Chip architectures
The trend towards integrating multiple cores on the same die has accentuated the need for larger on-chip caches. Such large caches are constructed as a multitude of smaller cache ...
Reetuparna Das, Asit K. Mishra, Chrysostomos Nicop...
HPCA
2005
IEEE
14 years 8 months ago
Checkpointed Early Load Retirement
Long-latency loads are critical in today's processors due to the ever-increasing speed gap with memory. Not only do these loads block the execution of dependent instructions,...
Nevin Kirman, Meyrem Kirman, Mainak Chaudhuri, Jos...
HPCA
2005
IEEE
14 years 8 months ago
Tapping ZettaRAMTM for Low-Power Memory Systems
ZettaRAMTM is a new memory technology under development by ZettaCoreTM as a potential replacement for conventional DRAM. The key innovation is replacing the conventional capacitor...
Ravi K. Venkatesan, Ahmed S. Al-Zawawi, Eric Roten...