2 search results - page 1 / 1 » Using At-Speed BIST to Test LVDS Serializer Deserializer Fun... |
ET
2002
13 years 10 months ago
2002
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
ITC
2003
IEEE
14 years 4 months ago
2003
IEEE
High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using ci...